Modelling the Interaction Forces between an Ideal Measurement Surface and the Stylus Tip of a Novel Vibrating Micro-scale CMM Probe
Abstract
This paper describes the development of an
analytical model to describe a novel three-axis vibrating micro-scale
probe for micro-co-ordinate measuring machines (micro-CMMs). The
micro-CMM probe is vibrated in three axes, in order to address the
problems inherent with micro- and nano-scale co-ordinate measurements
caused by surface interaction forces. These surface forces have been
investigated and a mathematical model describing an ideal probing
situation has been developed. The vibration amplitude required for the
probe to overcome the surface interaction forces has been calculated
using this model. The results of initial vibration experiments are
reported and the suitability of the probe to counteract the surface
interaction forces is confirmed.
Domains
Digital Libraries [cs.DL]Origin | Files produced by the author(s) |
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