Ion implantation Indium oxide 27Ald p&α Gold 7630Lh Silicon Carbide Nitridation 7550Ee ADSORPTION DESORPTION HYSTERESIS X-ray diffraction Nanoparticles Thin film Rutherford backscattering spectrometry RBS Charge exchange Pulsed laser deposition Topological defects Alloys 15N Low energy electron diffraction LEED Acoustic XPS Aluminium EPR Evaluation Nickel Periodic multilayer AFM NRP Ageing Density functional theory NRA Measurement 8140Ef 17Op 13C Adsorbed layers 3C-SiC Photoluminescence Magnetic semiconductors Acoustic propreties of solid Auger electron spectroscopy AES Hysteresis Oxidation GaMnAs Silicon Magnetic anisotropy Isotopic Tracing Epitaxial growth Silicon carbide Raman spectroscopy Defects 6855Jk Transparent conductive oxide TCO Annealing Metal-insulator transition Topological insulators Passivation Adsorption 27Aldp Ion beam analysis Aluminum AC susceptibility RBS Oxygen deficiency 17Opp Kossel diffraction Nanostructures Gallium oxide Adsorption Isotherms 7550Pp ALD Magnetization curves Nuclear resonance profiling NRP Diffusion Interface defects 18O 18O resonance PIXE Capillary condensation Sputtering Growth Energy loss XRD Multilayer Thin films Nuclear reaction analysis HfO2 Pb centers Channeling Stable isotopic tracing Ferromagnetic resonance Atomic Layer Deposition ALD Silica 27Alda Zinc oxide SiC 17O 2H Al2O3 Epitaxy